The impressive precision with which particles can be localized, down to ±1.5 nm but more typically ... High-resolution tracking in 3D is possible 8. As the topography of live cells is measurable ...
A new technical paper titled “Enhancing the precision of 3D sidewall measurements of photoresist using atomic force microscopy with a tip-tilting technique” by researchers at National Metrology ...
To examine the sample surfaces in three dimensions (3D), users need the 3DSM, ZEISS’ optional software package. Users can obtain topographical information by rebuilding a full 3D model of the sample’s ...
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